detailed description:

Polyk Technologies has developed a spectral dielectric measurement system under high electric fields, which better solves the problem of nonlinear dielectric response.

Nonlinear dielectric response:
-When measuring the dielectric constant through LCR meter or analyzer (Agilent/Keysight 4284A, E4980A, 4294A), the loading voltage is usually around 1V; However, many piezoelectric ceramics (PZT) and polymers (PVDF) exhibit nonlinear responses to the applied electric field; Usually, their dielectric constant and loss factor become lower under high voltage.
-In many applications, such as capacitors and drivers, operating under high electric fields with dielectric layers>10V/um or 100V/um, their effective dielectric constant and loss tan δ are very unsuitable for measurement values @ 1Vrms in ordinary LCR meters and impedance analyzers.
-Directly loading a high-voltage signal during dielectric testing poses a significant risk of damage to expensive LCR meters if the sample suddenly experiences dielectric breakdown.

Therefore, Polyk Technologies in the United States has developed this broadband dielectric measurement system, which effectively avoids the occurrence of the above-mentioned problems.

Technical specifications:
1) Maximum voltage: ± 4000V;
2) Maximum current: ± 20mA;
3) Frequency range: 100Hz to 1MHz;
4) Capacitor range: 100pF to 100nF;
5) Temperature range:- 184℃ to 250℃；

6) Temperature control chamber:- 75℃ to 200℃； (Optional)

7) Temperature control chamber: room temperature to 1000 ℃; (Optional)
8) Broadband range: 20 Hz to 1 MHz or 110 MHz, Or 0.01 Hz to 1 MHz (related to the impedance analyzer equipped); (Optional)
9) Large AC signal unit; (Optional)

Welcome to inquire!